Showing results: 91 - 105 of 268 items found.
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RAMCHECK LX -
INNOVENTIONS, Inc.
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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4310 IN -
Standard Electric Works Co., Ltd
• Protection class: IP65 (Lid closed)• 2 Lines × 16 Characters LCD• Microprocessor-controlled• Tests insulation resistance up to 2 TΩ • 4 Insulation test voltages: 1000V, 2500V, 5000V, 10000V• AC / DC Voltmeter (30~600V)• Short-circuit current up to 5mA• PI (Polarization Index) indication• DAR (Dielectric Absorption Ratio) indication• Auto-ranging on all insulation ranges• Auto-hold function to freeze reading• Overload protection• Adjustable testing duration: 1~30 minutes• Internal memory for data storage• Displays testing duration for insulation measurement • Auto-off function• 200 measurement results can be saved in memory and recalled on display
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4305 IN -
Standard Electric Works Co., Ltd
• Protection class: IP65 (Lid closed)• 2 Lines × 16 Characters LCD• Microprocessor-controlled• Tests insulation resistance up to 1 TΩ • 4 Insulation test voltages: 500V, 1000V, 2500V, 5000V• AC / DC Voltmeter (30~600V)• Short-circuit current up to 5mA• PI (Polarization Index) indication• DAR (Dielectric Absorption Ratio) indication• Auto-ranging on all insulation ranges• Auto-hold function to freeze reading• Overload protection• Adjustable testing duration: 1~30 minutes• Internal memory for data storage• Displays testing duration for insulation measurement • Auto-off function• 200 measurement results can be saved in memory and recalled on display
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FS2521 -
FuturePlus Systems
The FS2521 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4164A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs. Now qualified at 3200MT/s
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JT 37x7/PCI -
JTAG Technologies Inc.
High speed and performance JTAG Boundary-scan PCI PC plug-in controller for PCI bus slot or PCIe PC plug-in controller for PCI Express bus slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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SGDK320A (SD Host Tester) -
TDK SolidGear Corporation
SGDK320A (SD Host Tester) is a product that has the functions of SD emulator (SD Emulator), host tester (Host Tester), SD analyzer (SD Analyzer), and eMMC analyzer (eMMC Analyzer). Supports SD Memory Card Physical Layer Specification Version 3.01. It covers the test contents of Test Specification Ver3.00 and Supplement Note. Supports SDR104 and eMMC ver4.41 (analyzer).
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P9001A -
Keysight Technologies
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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QT-8000 Series -
PowerTECH Co,Ltd.
Tester is applicable to regularDC/AC parameter testing and IC device performance testing. Main application: Power Management; Digital Consumer Products; Communication& Interface; Automotive; Energy Conservation electronics; Standard Linear Circuit; Memory; CPU Chips; Special Customized IC and Wafer Test.
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ScanDIMM -
Corelis, Inc.
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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EDigital-Series™ -
Teradyne, Inc.
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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T3DSO1000 Series -
Teledyne LeCroy
Teledyne Test Tools new T3DSO1000 Oscilloscopes feature two channel and four channel models. The two channel model is available with 100 MHz, a single ADC with a 1 GSa/s maximum sample rate, and a single memory module with 14 Mpts of sample memory. The four channel scope is available in 100 and 200 MHz models and incorporates two 1 GSa/s ADCs and two 14 Mpts memory modules. When all channels are enabled, each channel has sample rate of 500 MSa/s and a standard record length of 7 Mpts. When only a single channel per ADC is active, the maximum sample rate is 1 GSa/s and the maximum record length is 14 Mpts. For ease-of-use, the most commonly used functions can be accessed with its user-friendly front panel design.
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Mountz Inc.
A dial torque wrench is an essential tool in torque measurement, as it provides quality control in regards to monitoring and verifying torque. This tool is commonly used to test, audit, and verify torque applied to joints. Using the memory pointer, the dial torque wrench will capture finishing torque that is applied to any fastener.
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Pacific Instruments, Inc.
Data acquired by the 5800 is digitized and recorded in non-volatile, solid-state memory. It records calibration, pre-trigger and post-trigger data. In a typical test scenario recording of pre-trigger data is initiated by a TTL input, program instruction, or automatic sequencer. A TTL input or on-board discriminator triggers post trigger data recording.
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NX Pro -
Dynalab Test Systems, Inc.
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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LX-1024A+ -
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·1024 Max. Test Points ,(Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Using Embedded Linux operating system，．·Adopted high resolution colour 640*480 TFT LCD ,．·Large 320×240 LCD display ,．·Instant test time :0-60s , optional adjustment.．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,
